Please use this identifier to cite or link to this item:
https://repositorio.ufba.br/handle/ri/14664
metadata.dc.type: | Artigo de Periódico |
Title: | Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns |
Other Titles: | Physica A: Statistical Mechanics and its Applications |
Authors: | Rosa, R. R. Baroni, M. P. M. A. Zaniboni, G. T. Silva, A. Ferreira da Roman, L. S. Pontes, J. Bolzan, M. J. A. |
metadata.dc.creator: | Rosa, R. R. Baroni, M. P. M. A. Zaniboni, G. T. Silva, A. Ferreira da Roman, L. S. Pontes, J. Bolzan, M. J. A. |
Abstract: | This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales. |
Keywords: | Disordered surfaces Structural complexity Gradient pattern analysis Wavelet multiresolution analysis Euler characteristic KPZ equation Porous silicon |
metadata.dc.rights: | Acesso Aberto |
URI: | http://repositorio.ufba.br/ri/handle/ri/14664 |
Issue Date: | 2007 |
Appears in Collections: | Artigo Publicado em Periódico (FIS) |
Files in This Item:
File | Description | Size | Format | |
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1-s2.0-S0378437107009557-main.pdf | 429,12 kB | Adobe PDF | View/Open |
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