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https://repositorio.ufba.br/handle/ri/7965
metadata.dc.type: | Artigo de Periódico |
Título : | Characterization of asymmetric fragmentation patterns in SFM images of porous silicon |
Otros títulos : | Solid State Communications |
Autor : | Silva, A. Ferreira da Rosa, R.R. Roman, L.S. Veje, E. Pepe, Iuri Muniz |
metadata.dc.creator: | Silva, A. Ferreira da Rosa, R.R. Roman, L.S. Veje, E. Pepe, Iuri Muniz |
Resumen : | Due to possible technological applications in opto-electronic devices, the interest in characterizing porous silicon structure patterns has recently increased. From scanning force microscopy (SFM) we have obtained images of different samples of porous silicon and applied pattern characterization operators on these matrices. In this paper, asymmetric spatial fragmentation in amplitude envelopes of porous silicon samples are characterized by means of a parameter that quantifies the amount of spatial asymmetry in the gradient field. The results show that this method is well suited to characterize silicon porosity quantitatively. |
Palabras clave : | A. Semiconductors B. Nanofabrications C. Crystal structure and symmetry D. Optical properties |
URI : | http://www.repositorio.ufba.br/ri/handle/ri/7965 |
Fecha de publicación : | 2000 |
Aparece en las colecciones: | Artigo Publicado em Periódico (FIS) |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
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silva.pdf Restricted Access | 300,04 kB | Adobe PDF | Visualizar/Abrir Request a copy |
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