Imaging gas concentration in the field ion microscope: a theoretical analysis

Castilho, Caio Mário Castro de; Ktngham, David R.

dc.contributor.author	Castilho, Caio Mário Castro de
dc.contributor.author	Ktngham, David R.
dc.creator	Castilho, Caio Mário Castro de
dc.creator	Ktngham, David R.
dc.date.accessioned	2012-01-11T00:15:23Z
dc.date.available	2012-01-11T00:15:23Z
dc.date.issued	1988
dc.identifier.issn	0039-6028
dc.identifier.uri	http://www.repositorio.ufba.br/ri/handle/ri/5106
dc.description	p. 568-586	pt_BR
dc.description.abstract	A Boltzmann equation method for calculating the gas concentration in the field ion microscope is proposed. A simple model for the molecule’s bouncing movement is presented. Numerical results are given and the formation of an imaging gas adsorbed layer is discussed. Within this model, no evidence is found which suggests that local variation in imaging gas concentration is the basic mechanism of image formation in the FIM. The results show limits on the values of tip field and or tip temperature, for which an adsorbed layer can be formed.	pt_BR
dc.language.iso	en	pt_BR
dc.title	Imaging gas concentration in the field ion microscope: a theoretical analysis	pt_BR
dc.title.alternative	Surface Science	pt_BR
dc.type	Artigo de Periódico	pt_BR
dc.identifier.number	v. 204	pt_BR