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Please use this identifier to cite or link to this item: http://repositorio.ufba.br/ri/handle/ri/14664

Title: Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
Other Titles: Physica A: Statistical Mechanics and its Applications
Authors: Rosa, R. R.
Baroni, M. P. M. A.
Zaniboni, G. T.
Silva, A. Ferreira da
Roman, L. S.
Pontes, J.
Bolzan, M. J. A.
Keywords: Disordered surfaces;Structural complexity;Gradient pattern analysis;Wavelet multiresolution analysis;Euler characteristic;KPZ equation;Porous silicon
Issue Date: 2007
Abstract: This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.
Description: Texto completo: acesso restrito. p. 666-673
URI: http://repositorio.ufba.br/ri/handle/ri/14664
Appears in Collections:Artigos Publicados em Periódicos (FIS)

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