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Please use this identifier to cite or link to this item: http://repositorio.ufba.br/ri/handle/ri/13234

Title: Ion trajectories in atom probe field ion microscopy and gas field ion sources
Other Titles: Journal of Physics D: Applied Physics
Authors: Castilho, Caio Mário Castro de
Issue Date: 1999
Publisher: Journal of Physics D: Applied Physics
Abstract: Trajectories of positive ions produced in a region close to a structured surface, modelled by spherical or spheroidal protrusions and kept at a positive electric potential with respect to a distant screen or detector are calculated. The results are discussed in comparison with similar practical situations produced by field ionization and field evaporation or desorption, such as those occurring in gas field ion sources, field ion microscopy and field desorption spectroscopy.
Description: Texto completo. Acesso restrito. p. 2261–2265
URI: http://www.repositorio.ufba.br/ri/handle/ri/13234
ISSN: 0022-3727
Appears in Collections:Artigos Publicados em Periódicos (FIS)

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